ETCH STOP LAYER FOR MEMORY DEVICE FORMATION

The present disclosure relates to an integrated chip in some embodiments. The integrated chip includes an inter-level dielectric (ILD) laterally surrounding a memory device. One or more sidewall spacers are arranged along opposing sides of the memory device. The one or more sidewall spacers have a b...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Huang, Sheng-Huang, Min, Chung-Chiang, Chuang, Harry-Hak-Lay, Chen, Sheng-Chang, Wang, Hung Cho
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure relates to an integrated chip in some embodiments. The integrated chip includes an inter-level dielectric (ILD) laterally surrounding a memory device. One or more sidewall spacers are arranged along opposing sides of the memory device. The one or more sidewall spacers have a bottom surface over a bottom of the memory device. An etch stop layer is disposed on the one or more sidewall spacers and along the opposing sides of the memory device. An upper interconnect is arranged directly over the memory device, a top surface of the one or more sidewall spacers, and an upper surface of the etch stop layer. The upper surface of the etch stop layer is vertically below a top of the memory device