SYSTEMS AND METHODS FOR ASSESSING DEVIATIONS OF A SURFACE FROM A DESIGN PLAN

Systems and methods for assessing deviations of a surface from a design plan are provided. Disclosed embodiments may involve receiving, from a scanning system, a point cloud associated with a surface, the point cloud including a discrete set of data points. Disclosed embodiments may involve sorting,...

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Bibliographische Detailangaben
Hauptverfasser: KELLER, Karl, CLAY, III, James W
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Systems and methods for assessing deviations of a surface from a design plan are provided. Disclosed embodiments may involve receiving, from a scanning system, a point cloud associated with a surface, the point cloud including a discrete set of data points. Disclosed embodiments may involve sorting, using a k-dimensional tree, and downsampling, using voxels, the discrete set of data points. Disclosed embodiments may involve producing a voxel grid geometry. Further, disclosed embodiments may involve superimposing, using the k-dimensional tree, the voxel grid geometry and the point cloud and producing data by computing normal, curvature, and spherical coordinates using both the point cloud and the voxel grid geometry separately. Further, disclosed embodiments may involve determining, using the voxel grid geometry and k-dimensional tree, point-by-point deflection.