METHOD, DEVICE, AND SYSTEM FOR ESTIMATING THRESHOLD VALUE OF KERNEL DENSITY FUNCTION WITH RESPECT TO DEFECT OF PRODUCT

METHOD, DEVICE, AND SYSTEM FOR ESTIMATING THRESHOLD VALUE OF KERNEL DENSITY FUNCTION WITH RESPECT TO DEFECT OF PRODUCT

Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method se...

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Bibliographische Detailangaben
Hauptverfasser: Choe, Jaemyung, Huh, In, Cha, Moonhyun, An, Taeyoon, Bae, Sangjune, You, Joohyung
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method selected according to a number of sample data from among a plurality of bandwidth estimation methods, estimating threshold values corresponding to a tail region of the kernel density function based on the optimal kernel bandwidths, and providing a quantitative value for quantifying uncertainty of the threshold values based on the plurality of threshold values.