SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME

A test device for testing a semiconductor, the test device comprising: a pulse signal generator that is configured to generate a first pulse signal and transmit the first pulse signal through channels; a sampler that is configured to receive the first pulse signal through the channels and conduct a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE, Seongkwan, CHOI, Jaemoo, KANG, Minho, PARK, Cheolmin, WON, Junyeon
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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