SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME

A test device for testing a semiconductor, the test device comprising: a pulse signal generator that is configured to generate a first pulse signal and transmit the first pulse signal through channels; a sampler that is configured to receive the first pulse signal through the channels and conduct a sampling process on the first pulse signal, based on a second pulse signal; a width analyzer that is configured to measure a first width of the first pulse signal and generate a first measurement value, based on a result of the sampling process; and a calculator that is configured to output a test result corresponding to each of the channels of the test device, based on the first measurement value.