CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR

In some examples, a method of performing measurement of a device under test (DUT) coupled to a connector includes determining a first voltage signal representative of a current of the DUT, the current flowing through the connector. The method also includes determining a second voltage signal represe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NANDI, Gautam Salil, THINAKARAN, Rajavelu, SRINIVASAN, Hariharan
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In some examples, a method of performing measurement of a device under test (DUT) coupled to a connector includes determining a first voltage signal representative of a current of the DUT, the current flowing through the connector. The method also includes determining a second voltage signal representative of a voltage of the DUT, as provided at the connector. The method also includes determining a calibration current according to the first voltage signal. The method also includes modifying measurement of the DUT according to the calibration current.