PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL
Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method in...
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creator | NIYOGI, Sandip VADLADI, Dileep Venkata Sai HUANG, Lily LIU, Wei |
description | Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method includes generating a plasma within the gas injection channel. The plasma includes helium radicals and nitrogen radicals. The method includes delivering the plasma from the plasma source to a process chamber including a substrate. The method includes producing a treated substrate by processing the substrate with the plasma within the process chamber, in which processing the substrate includes contacting the plasma including the helium radicals and nitrogen radicals with a first side of the substrate. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024304422A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024304422A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024304422A13</originalsourceid><addsrcrecordid>eNrjZDAL8HEM9nVUCAjyd3YNDvb0c1cI9wzxUPD0c3ENcAUSfiEKIa6-Aa5BjiGhQa4Kzv5-IUH-PjwMrGmJOcWpvFCam0HZzTXE2UM3tSA_PrW4IDE5NS-1JD402MjAyMTYwMTEyMjR0Jg4VQDg8Skz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL</title><source>esp@cenet</source><creator>NIYOGI, Sandip ; VADLADI, Dileep Venkata Sai ; HUANG, Lily ; LIU, Wei</creator><creatorcontrib>NIYOGI, Sandip ; VADLADI, Dileep Venkata Sai ; HUANG, Lily ; LIU, Wei</creatorcontrib><description>Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method includes generating a plasma within the gas injection channel. The plasma includes helium radicals and nitrogen radicals. The method includes delivering the plasma from the plasma source to a process chamber including a substrate. The method includes producing a treated substrate by processing the substrate with the plasma within the process chamber, in which processing the substrate includes contacting the plasma including the helium radicals and nitrogen radicals with a first side of the substrate.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240912&DB=EPODOC&CC=US&NR=2024304422A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76304</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240912&DB=EPODOC&CC=US&NR=2024304422A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NIYOGI, Sandip</creatorcontrib><creatorcontrib>VADLADI, Dileep Venkata Sai</creatorcontrib><creatorcontrib>HUANG, Lily</creatorcontrib><creatorcontrib>LIU, Wei</creatorcontrib><title>PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL</title><description>Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method includes generating a plasma within the gas injection channel. The plasma includes helium radicals and nitrogen radicals. The method includes delivering the plasma from the plasma source to a process chamber including a substrate. The method includes producing a treated substrate by processing the substrate with the plasma within the process chamber, in which processing the substrate includes contacting the plasma including the helium radicals and nitrogen radicals with a first side of the substrate.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAL8HEM9nVUCAjyd3YNDvb0c1cI9wzxUPD0c3ENcAUSfiEKIa6-Aa5BjiGhQa4Kzv5-IUH-PjwMrGmJOcWpvFCam0HZzTXE2UM3tSA_PrW4IDE5NS-1JD402MjAyMTYwMTEyMjR0Jg4VQDg8Skz</recordid><startdate>20240912</startdate><enddate>20240912</enddate><creator>NIYOGI, Sandip</creator><creator>VADLADI, Dileep Venkata Sai</creator><creator>HUANG, Lily</creator><creator>LIU, Wei</creator><scope>EVB</scope></search><sort><creationdate>20240912</creationdate><title>PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL</title><author>NIYOGI, Sandip ; VADLADI, Dileep Venkata Sai ; HUANG, Lily ; LIU, Wei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024304422A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>NIYOGI, Sandip</creatorcontrib><creatorcontrib>VADLADI, Dileep Venkata Sai</creatorcontrib><creatorcontrib>HUANG, Lily</creatorcontrib><creatorcontrib>LIU, Wei</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NIYOGI, Sandip</au><au>VADLADI, Dileep Venkata Sai</au><au>HUANG, Lily</au><au>LIU, Wei</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL</title><date>2024-09-12</date><risdate>2024</risdate><abstract>Embodiments of the present disclosure generally relate to inductively coupled plasma sources and plasma processing apparatus. In at least one embodiment, a plasma processing method includes introducing a gas including helium and nitrogen into a gas injection channel of a plasma source. The method includes generating a plasma within the gas injection channel. The plasma includes helium radicals and nitrogen radicals. The method includes delivering the plasma from the plasma source to a process chamber including a substrate. The method includes producing a treated substrate by processing the substrate with the plasma within the process chamber, in which processing the substrate includes contacting the plasma including the helium radicals and nitrogen radicals with a first side of the substrate.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | PLASMA PROCESSING WITH INDEPENDENT TEMPERATURE CONTROL |
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