LEARNING DEVICE AND TEST DEVICE FOR TRAINING STUDENT NEURAL NETWORK

Machine learning and testing devices are provided. The device applies a neural network operation of a first student neural network to a training image to generate first prediction information, applies a neural network operation of a second student neural network to generate second prediction informa...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Cho, Jae Hoon, Park, Jae Hyeon, Park, Hyun Kook
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING PHYSICS
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Machine learning and testing devices are provided. The device applies a neural network operation of a first student neural network to a training image to generate first prediction information, applies a neural network operation of a second student neural network to generate second prediction information, applies an error identification operation to a first integrated image to generate first error identification prediction information, applies the error identification operation to a second integrated image to generate second error identification prediction information, applies a network operation of a first teacher neural network to the training image to generate first pseudo label information, applies a neural network operation of a second teacher neural network to the training image to generate second pseudo label information, back-propagates a loss and updates parameters of the first and second student neural networks.