DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING

Aspects of the present disclosure provide techniques and apparatus for distributed built-in self-test. An example method of testing circuitry includes testing, in a first occasion, a first electrical circuit, having a first component, using at least a second component of a second electrical circuit;...

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Bibliographische Detailangaben
Hauptverfasser:	ROSIK, Raymond, WALKER, Brett, HE, Huiqiao, LUKIC, Zdravko
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Aspects of the present disclosure provide techniques and apparatus for distributed built-in self-test. An example method of testing circuitry includes testing, in a first occasion, a first electrical circuit, having a first component, using at least a second component of a second electrical circuit; and testing, in a second occasion, the second electrical circuit using at least the first component of the first electrical circuit.