PREDICTING FAILURE OF A MEDICAL DEVICE PART USING OPERATIONAL AND NON-OPERATIONAL DATA

Data is received from a plurality of devices each having a same target part subject to failure. The received data is used to determine, for each of at least a subset of the plurality of devices, a part failure date on which the target part failed in that device. A set of features usable to predict failure of the target part is engineered, the set of features including one or more features that are not based on logged warning or error events. At least a subset of the data is labeled and aggregated over one or more days. The labeled and aggregated data is used to train a machine learning model configured to be used to predict failure of the target part in a device based on recent data from that device, including by computing from the data features corresponding to the programmatically engineered a set of features.