AUTOMATIC BOARD PROBING STATION

Systems and methods herein are for an automatic board probing station in which a plurality of probe tips are associated with a plurality of probe arms and with a plurality of motorized connectors, where the plurality of motorized connectors is to cause individual ones of the plurality of probe tips...

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Bibliographische Detailangaben
Hauptverfasser:	Garanton, Daniel, Hoser, Kevin Matthew, Cummings, Audrey Grace, Thakur, Akhilesh Sandeep, Albright, Ryan Kelsey, Watkins, Zachary Jacob, Fourie, Frans Johannes, Barcenas, Jose Eduardo, Skidmore, Grant Michael, Bruslind, Jorian Matias
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Systems and methods herein are for an automatic board probing station in which a plurality of probe tips are associated with a plurality of probe arms and with a plurality of motorized connectors, where the plurality of motorized connectors is to cause individual ones of the plurality of probe tips and individual ones of the plurality of probe arms to be movable independently, and where the plurality of probe tips is to communicate probe signals with a circuit analysis system and is to concurrently probe a plurality of probe points of a circuit board.