NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SYSTEM

This non-destructive inspection system 1 has a non-destructive inspection device 2 and a management device 3. The non-destructive inspection device 2 is provided with: a neutron emission unit 10 capable of emitting a neutron beam; a gamma ray detection unit 20 capable of detecting gamma rays; a devi...

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Bibliographische Detailangaben
Hauptverfasser:	NAGANO, Shigenori, YAJIMA, Akira, OTAKE, Yoshie, YANOBE, Satoshi, ISHIGURO, Satoru, AIKOH, Hanako, WAKABAYASHI, Yasuo, TAKAMURA, Masato
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	This non-destructive inspection system 1 has a non-destructive inspection device 2 and a management device 3. The non-destructive inspection device 2 is provided with: a neutron emission unit 10 capable of emitting a neutron beam; a gamma ray detection unit 20 capable of detecting gamma rays; a device casing 30 covering the neutron emission unit 10 and the gamma ray detection unit 20, an opening 30a being formed in the device casing 30; an outer shutter 31 that opens/closes the opening 30a; dose monitors 51, 52, 53 provided to the device casing 30, the dose monitors 51, 52, 53 detecting the radiation dose; a device communication unit 56 capable of transmitting device information including the detected radiation dose to the management device 3, and capable of receiving inspection permission information from the management device 3; and a device control unit 40 that, when the inspection permission information is acquired, opens the outer shutter 31 and enables emission of a neutron beam from the neutron emission unit 10.