INFORMATION PROCESSING APPARATUS, METHOD, AND SYSTEM

An information processing apparatus includes processing circuitry. The processing circuitry acquires measurement data from a plurality of sensors configured to measure different items. The processing circuitry estimates whether or not there is an abnormality in any of the plurality of sensors, based...

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Bibliographische Detailangaben
Hauptverfasser:	OKUDERA, Shohei, KONDO, Moe, MORISHIMA, Ryuji, OMURA, Shuho
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	An information processing apparatus includes processing circuitry. The processing circuitry acquires measurement data from a plurality of sensors configured to measure different items. The processing circuitry estimates whether or not there is an abnormality in any of the plurality of sensors, based on the acquired measurement data of the items and measurement data of the items acquired in the past. The processing circuitry corrects measurement data measured by a sensor estimated to have an abnormality, based on the acquired measurement data of the items and the measurement data of the items acquired in the past.