DISTORTION OF PULSES FOR WAFER BIASING

Various embodiments herein relate to apparatuses and methods for distortion of pulses for wafer biasing. In some embodiments, a method is provided, the method comprising: causing a distorted pulse to be applied to an electrode of a pedestal such that the distorted pulse at least partially compensate...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Leeser, Karl Frederick, Holland, John
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Various embodiments herein relate to apparatuses and methods for distortion of pulses for wafer biasing. In some embodiments, a method is provided, the method comprising: causing a distorted pulse to be applied to an electrode of a pedestal such that the distorted pulse at least partially compensates for attenuation between the pedestal and the substrate, and such that a waveform resulting from the distorted pulse, when imparted to the substrate, is substantially square.