Processing Chamber With Multiple Plasma Units

Provided is a processing chamber configured to contain a semiconductor substrate in a processing region of the chamber. The processing chamber includes a remote plasma unit and a direct plasma unit, wherein one of the remote plasma unit or the direct plasma unit generates a remote plasma and the oth...

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Bibliographische Detailangaben
Hauptverfasser: Ravi, Jallepally, Xu, Yi, Kuratomi, Takashi, Wu, Dien-Yeh, Lei, Pingyan, Daito, Kazuya, Lei, Yu
Format: Patent
Sprache:eng
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Zusammenfassung:Provided is a processing chamber configured to contain a semiconductor substrate in a processing region of the chamber. The processing chamber includes a remote plasma unit and a direct plasma unit, wherein one of the remote plasma unit or the direct plasma unit generates a remote plasma and the other of the remote plasma unit or the direct plasma unit generates a direct plasma. The combination of a remote plasma unit and a direct plasma unit is used to remove, etch, clean, or treat residue on a substrate from previous processing and/or from native oxide formation. The combination of a remote plasma unit and direct plasma unit is used to deposit thin films on a substrate.