GRAIN FLAKE MEASUREMENT SYSTEM, GRAIN FLAKE MEASUREMENT METHOD, AND GRAIN FLAKE COLLECTION, MOVEMENT, AND MEASUREMENT SYSTEM

This invention describes a measurement system (100), a measurement method, and a collection, movement, and measurement system for grains (200) run through a flaking process, in order to define the grain flake thickness. The grain flake measurement system comprises: an image collection device (110) c...

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Bibliographische Detailangaben
Hauptverfasser: Oliveira Barbosa, Flávio Gabriel, Seibert, Artur Antonio, Bonnard, Renan, Molgaro, André Luís, Monteiro Veras, Rafael, Oliveira Cabeça Neves, Carlos Fernando
Format: Patent
Sprache:eng
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Zusammenfassung:This invention describes a measurement system (100), a measurement method, and a collection, movement, and measurement system for grains (200) run through a flaking process, in order to define the grain flake thickness. The grain flake measurement system comprises: an image collection device (110) configured to collect an image of one of the grain flakes; and an acquisition unit (120) configured to receive the of the collected grain flake image through the image collection device and perform a measurement of the grain flake thickness. The grain flake measurement method comprises the steps of: collecting (560) a grain flake image through an image collection device; and measuring (561) the grain flake thickness through the collected image. The grain flake collection, movement, and measurement system (200) comprises: a grain flake collection device (210); a measurement device (130); a movement and selection device (220); an acquisition unit (120); and a command unit (230).