APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest confi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Riehl, Kenneth, Schroeder, Jeremy D, Fischels, Collin Richard, Melecio Ramirez, Juan Ignacio
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest configured to couple to the device under test and to permit at least a portion of the probe to pass through an opening of the device under test.