Surface Characterization Module and System Including Same

Various embodiments of a module or apparatus for characterization of surface quality of a surface of a substrate and a system that includes such apparatus are disclosed. The apparatus includes a sensor configured to detect at least one property of the surface of the substrate or ambient environment...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Vance, Victor F, Lahti, Kaitlyn M, Platta, Marti Marie Joyer, Biernath, Rolf W, Kobe, James J, Przepasniak, Anne Marie, Kobe, Taylor J, Nyland, Bridget E, Latron, Damien
Format:	Patent
Sprache:	eng
Schlagworte:	CONVEYING HANDLING THIN OR FILAMENTARY MATERIAL HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PACKING PERFORMING OPERATIONS PHYSICS STORING TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	Various embodiments of a module or apparatus for characterization of surface quality of a surface of a substrate and a system that includes such apparatus are disclosed. The apparatus includes a sensor configured to detect at least one property of the surface of the substrate or ambient environment and provide a value indicative of the at least one property, and a processor coupled to the sensor. The processor is configured to determine at least one surface quality parameter of the surface based upon the value provided by the sensor, and determine at least one processing parameter for a surface bonding application based upon the at least one surface quality parameter.