DEFECT PROFILING AND TRACKING SYSTEM FOR PROCESS-MANUFACTURING ENTERPRISE

A defect profiling and tracking system for a process-manufacturing enterprise is provided. The system includes a memory and a processor. The processor is configured to access entity data for a plurality of entities of the process-manufacturing enterprise and process parameter data for one or more deviating entities. The processor is configured to analyze the entity data and the process parameter data for each of the deviating entities to determine a plurality of relationships between quality defects and the process parameters to generate a unique entity specific process signature (EPS) for each entity. The processor is configured to receive real-time process parameter data for one or more entities to generate a real-time process signature for the one or more entities and compare the real-time process signature of each entity with EPS corresponding to the entity to detect one or more EPS matches that are indicative of a quality defect.