SOCKET DEVICE FOR TESTING ICs

Proposed is a socket device for testing integrated circuits (ICs) used to test ICs. The socket device includes a contact module (100) for seating an IC and having a plurality of contacts (110) for electrical connection of a lead of the IC and a terminal of a printed circuit board (PCB), and a pusher...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	HWANG, Dong Weon, HWANG, Jae Baek, HWANG, Logan Jae
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Proposed is a socket device for testing integrated circuits (ICs) used to test ICs. The socket device includes a contact module (100) for seating an IC and having a plurality of contacts (110) for electrical connection of a lead of the IC and a terminal of a printed circuit board (PCB), and a pusher module (200) having a latch (211) to be fit-assembled from a top of the contact module (100) and for pressurizing the IC, wherein the pusher module (200) includes a lead frame (210) with the latch rotatably provided thereto, a pressurizing part (220) (230) assembled to the lead frame (210) with two floating hinge axes (C1) (C2) parallel to each other and elastically supported against the lead frame, first and second cam shafts (240) (250) provided in the respective floating hinge axes (C1) (C2), a handle (260), a lever (270), and a link (280).