Analysis Device, Specimen Production Device, Inspection Device, Operation Method for Specimen Production Device, and Operation Method for Inspection Device

An analysis device according to the present invention comprises: at least one inspection device that inspects a specimen; and at least one specimen production device that produces a specimen. The analysis device is provided with a data processing unit that processes data. The inspection device and the specimen production device are each provided with a communication unit for communicating with each other. The specimen production device is provided with a control unit that controls the specimen production device and a production unit that produces a specimen. The inspection device is provided with a control unit that controls the inspection device and an inspection unit that inspects a specimen. The data processing unit calculates a value [number of specimens A] representing the number of specimens which have not been delivered to the inspection device and a value [number of specimens B] representing the sum of the number of specimens for which inspection can be additionally started in the inspection device and the number of specimens which are being inspected and the inspection of which will be completed in a prescribed time. The control unit of the specimen production device prohibits production of a new specimen in the specimen production device when the [number of specimens A] and the [number of specimens B] satisfy a first relationship.