APPARATUS AND METHODS FOR PROGRAMMING MULTIPLE PARAMETERS PER PIN OF AN INTEGRATED CIRCUIT

APPARATUS AND METHODS FOR PROGRAMMING MULTIPLE PARAMETERS PER PIN OF AN INTEGRATED CIRCUIT

Apparatus and methods for programming multiple parameters per pin of an IC are disclosed herein. In certain embodiments, system operation parameters of an IC are set using external component(s) in conjunction with an internal detection circuit of the IC. The internal detection circuit allows for pro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Presti, Armando, Manlove, Gregory J, Huhmann, Douglas
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Apparatus and methods for programming multiple parameters per pin of an IC are disclosed herein. In certain embodiments, system operation parameters of an IC are set using external component(s) in conjunction with an internal detection circuit of the IC. The internal detection circuit allows for programming of multiple parameters with one pin of the IC, thereby reducing package size, board area, and/or chip complexity. For example, the teachings herein allow for detection of three or more unique parameters or states per pin, significantly reducing the part pin count and board area.