ACQUISITION TECHNIQUE WITH DYNAMIC k-SPACE SAMPLING PATTERN

During operation, the computer system may access or obtain a predefined sampling pattern. Then, the computer system may provide an instruction to a measurement device to perform a non-invasive measurement on at least a portion of an individual. Moreover, the computer system may receive, associated w...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Witzel, Thomas, Kaditz, Jeffrey H
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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