ACQUISITION TECHNIQUE WITH DYNAMIC k-SPACE SAMPLING PATTERN
During operation, the computer system may access or obtain a predefined sampling pattern. Then, the computer system may provide an instruction to a measurement device to perform a non-invasive measurement on at least a portion of an individual. Moreover, the computer system may receive, associated w...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | During operation, the computer system may access or obtain a predefined sampling pattern. Then, the computer system may provide an instruction to a measurement device to perform a non-invasive measurement on at least a portion of an individual. Moreover, the computer system may receive, associated with the measurement device, information associated with the non-invasive measurement. Based at least in part on the information, the computer system may determine an orientation and/or a scale associated with at least the portion of the individual. Next, the computer system may compute a modified sampling pattern based at least in part on the predefined sampling pattern and the determined orientation and/or the determined scale. Furthermore, the computer system may provide one or more second instructions to the measurement device to perform a second non-invasive measurement on at least the portion of the individual based at least in part on the modified sampling pattern. |
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