ACQUISITION TECHNIQUE WITH DYNAMIC k-SPACE SAMPLING PATTERN

During operation, the computer system may access or obtain a predefined sampling pattern. Then, the computer system may provide an instruction to a measurement device to perform a non-invasive measurement on at least a portion of an individual. Moreover, the computer system may receive, associated w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Witzel, Thomas, Kaditz, Jeffrey H
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:During operation, the computer system may access or obtain a predefined sampling pattern. Then, the computer system may provide an instruction to a measurement device to perform a non-invasive measurement on at least a portion of an individual. Moreover, the computer system may receive, associated with the measurement device, information associated with the non-invasive measurement. Based at least in part on the information, the computer system may determine an orientation and/or a scale associated with at least the portion of the individual. Next, the computer system may compute a modified sampling pattern based at least in part on the predefined sampling pattern and the determined orientation and/or the determined scale. Furthermore, the computer system may provide one or more second instructions to the measurement device to perform a second non-invasive measurement on at least the portion of the individual based at least in part on the modified sampling pattern.