PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES

PUF cells utilizing a dual-interlocking scheme demonstrating improved noise immunity and stability across different V/T conditions and different uses over time in noisy environments. The PUF cell may be advantageously utilized in conjunction with error detection techniques that screen out unstable c...

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Bibliographische Detailangaben
Hauptverfasser: Sinangil, Mahmut Ersin, Nedovic, Nikola, Kudva, Sudhir Shrikantha, Gray, Carl Thomas
Format: Patent
Sprache:eng
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Zusammenfassung:PUF cells utilizing a dual-interlocking scheme demonstrating improved noise immunity and stability across different V/T conditions and different uses over time in noisy environments. The PUF cell may be advantageously utilized in conjunction with error detection techniques that screen out unstable cells. A set of such PUF cells utilized to generate a device-specific bit pattern, for example a master key.