LITHOGRAPHIC APPARATUS AND METHOD FOR ILLUMINATION UNIFORMITY CORRECTION

A lithographic apparatus comprising an illumination system configured to condition a radiation beam and a uniformity correction system configured to adjust an intensity profile of the radiation beam. The lithographic apparatus comprises a control system configured to control the uniformity correctio...

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Bibliographische Detailangaben
Hauptverfasser: SOTIROPOULOS, Nikolaos, YPMA, Michael Frederik, HARTGERS, Albertus, STEEGHS, Marco Matheus Louis
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A lithographic apparatus comprising an illumination system configured to condition a radiation beam and a uniformity correction system configured to adjust an intensity profile of the radiation beam. The lithographic apparatus comprises a control system configured to control the uniformity correction system at least partially based on a thermal status criterion that is indicative of a thermal state of a part of the lithographic apparatus.