Semiconductor Device and Method

An embodiment is a device including a first fin extending from a substrate, a first gate stack over and along sidewalls of the first fin, a first gate spacer disposed along a sidewall of the first gate stack, a first epitaxial source/drain region in the first fin and adjacent the first gate spacer,...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Ko, Chung-Chi, Liao, Shu Ling
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An embodiment is a device including a first fin extending from a substrate, a first gate stack over and along sidewalls of the first fin, a first gate spacer disposed along a sidewall of the first gate stack, a first epitaxial source/drain region in the first fin and adjacent the first gate spacer, the first epitaxial source/drain region, and a protection layer between the first epitaxial source/drain region and the first gate spacer and between the first gate spacer and the first gate stack.