SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE ANALYSIS SYSTEM INCLUDING THE SAME, AND METHOD FOR ANALYZING SAMPLE USING THE SAME

A sample holder for a transmission electron microscope may include: a column part that extends in a first direction; a stage configured to receive a sample, the stage disposed at a first end portion of the column part; a motor part disposed at a second end portion of the column part; and a thermoele...

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Bibliographische Detailangaben
Hauptverfasser: KWON, DONGHOON, CHOI, YEOSEON
Format: Patent
Sprache:eng
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Zusammenfassung:A sample holder for a transmission electron microscope may include: a column part that extends in a first direction; a stage configured to receive a sample, the stage disposed at a first end portion of the column part; a motor part disposed at a second end portion of the column part; and a thermoelectric cooling device disposed inside the column part.