STEALTHY PROCESS ATTACK DETECTION FOR AUTOMATED MANUFACTURING

Additive manufacturing's reliance on embedded computing renders it vulnerable to tampering through cyber-attacks. Sensor instrumentation of additive manufacturing devices allows for rigorous process and security monitoring, but also results in a massive volume of noisy data for each run. As suc...

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Hauptverfasser: Ericson, Milton N, Yoginath, Srikanth B, Tansakul, Varisara, Jordan, Robert C, Dawson, Joel A, Iannacone, Michael D, Long, Gavin B, Passian, Ali, Asiamah, Joel M
Format: Patent
Sprache:eng
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Zusammenfassung:Additive manufacturing's reliance on embedded computing renders it vulnerable to tampering through cyber-attacks. Sensor instrumentation of additive manufacturing devices allows for rigorous process and security monitoring, but also results in a massive volume of noisy data for each run. As such, in-situ, near-real-time anomaly detection is challenging. A probabilistic-model-based approach addresses this challenge.