STEALTHY PROCESS ATTACK DETECTION FOR AUTOMATED MANUFACTURING
Additive manufacturing's reliance on embedded computing renders it vulnerable to tampering through cyber-attacks. Sensor instrumentation of additive manufacturing devices allows for rigorous process and security monitoring, but also results in a massive volume of noisy data for each run. As suc...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Additive manufacturing's reliance on embedded computing renders it vulnerable to tampering through cyber-attacks. Sensor instrumentation of additive manufacturing devices allows for rigorous process and security monitoring, but also results in a massive volume of noisy data for each run. As such, in-situ, near-real-time anomaly detection is challenging. A probabilistic-model-based approach addresses this challenge. |
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