METHOD FOR MEASURING WIDTH AND EDGE PROFILE OF A SINGLE BOARD IN A STACK OF MULTIPLE BOARDS

METHOD FOR MEASURING WIDTH AND EDGE PROFILE OF A SINGLE BOARD IN A STACK OF MULTIPLE BOARDS

This disclosure provides systems and methods for continuous wallboard manufacturing, and in particular methods that include measuring a wallboard width and edge profiles in a post-kiln stack of at least two wallboards or more with a laser scanner, preferably a two-dimensional (2D) laser scanner posi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Eversole, Leslie
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:This disclosure provides systems and methods for continuous wallboard manufacturing, and in particular methods that include measuring a wallboard width and edge profiles in a post-kiln stack of at least two wallboards or more with a laser scanner, preferably a two-dimensional (2D) laser scanner positioned at a distance from a post-kiln conveyor and performing a laser scan of the stack passing by on the post-kiln conveyor.