SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA

In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sen...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHENOY, Suresh, CITTERELLE, Kevin Bradley, KATAMREDDY, Krishna Sai Anirudh
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!