SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA

In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sen...

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Bibliographische Detailangaben
Hauptverfasser: SHENOY, Suresh, CITTERELLE, Kevin Bradley, KATAMREDDY, Krishna Sai Anirudh
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sensor, one or more second measured values of the measured object, the one or more second measured values corresponding to one or more second power consumption levels of the measured object at one or more second time points earlier than the first time point. The measurement processing circuitry may determine a corrected value based on the first measured value and the one or more second measured values, the corrected value representing the first power consumption level of the measured object at the first time point.