SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA

In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sen...

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Hauptverfasser:	SHENOY, Suresh, CITTERELLE, Kevin Bradley, KATAMREDDY, Krishna Sai Anirudh
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	SHENOY, Suresh CITTERELLE, Kevin Bradley KATAMREDDY, Krishna Sai Anirudh
description	In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sensor, one or more second measured values of the measured object, the one or more second measured values corresponding to one or more second power consumption levels of the measured object at one or more second time points earlier than the first time point. The measurement processing circuitry may determine a corrected value based on the first measured value and the one or more second measured values, the corrected value representing the first power consumption level of the measured object at the first time point.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024094269A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024094269A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024094269A13</originalsourceid><addsrcrecordid>eNrjZDANdvUL9g9S8HV1DA4NcvV19QtRcPYPCnJ1DvH091Nwcgx2dVEAMlx9AzyDPJ0dfRRcHEMceRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGRiYGliZGZpaOhMXGqAJVjKKA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA</title><source>esp@cenet</source><creator>SHENOY, Suresh ; CITTERELLE, Kevin Bradley ; KATAMREDDY, Krishna Sai Anirudh</creator><creatorcontrib>SHENOY, Suresh ; CITTERELLE, Kevin Bradley ; KATAMREDDY, Krishna Sai Anirudh</creatorcontrib><description>In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sensor, one or more second measured values of the measured object, the one or more second measured values corresponding to one or more second power consumption levels of the measured object at one or more second time points earlier than the first time point. The measurement processing circuitry may determine a corrected value based on the first measured value and the one or more second measured values, the corrected value representing the first power consumption level of the measured object at the first time point.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240321&DB=EPODOC&CC=US&NR=2024094269A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240321&DB=EPODOC&CC=US&NR=2024094269A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHENOY, Suresh</creatorcontrib><creatorcontrib>CITTERELLE, Kevin Bradley</creatorcontrib><creatorcontrib>KATAMREDDY, Krishna Sai Anirudh</creatorcontrib><title>SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA</title><description>In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sensor, one or more second measured values of the measured object, the one or more second measured values corresponding to one or more second power consumption levels of the measured object at one or more second time points earlier than the first time point. The measurement processing circuitry may determine a corrected value based on the first measured value and the one or more second measured values, the corrected value representing the first power consumption level of the measured object at the first time point.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDANdvUL9g9S8HV1DA4NcvV19QtRcPYPCnJ1DvH091Nwcgx2dVEAMlx9AzyDPJ0dfRRcHEMceRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGRiYGliZGZpaOhMXGqAJVjKKA</recordid><startdate>20240321</startdate><enddate>20240321</enddate><creator>SHENOY, Suresh</creator><creator>CITTERELLE, Kevin Bradley</creator><creator>KATAMREDDY, Krishna Sai Anirudh</creator><scope>EVB</scope></search><sort><creationdate>20240321</creationdate><title>SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA</title><author>SHENOY, Suresh ; CITTERELLE, Kevin Bradley ; KATAMREDDY, Krishna Sai Anirudh</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024094269A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHENOY, Suresh</creatorcontrib><creatorcontrib>CITTERELLE, Kevin Bradley</creatorcontrib><creatorcontrib>KATAMREDDY, Krishna Sai Anirudh</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHENOY, Suresh</au><au>CITTERELLE, Kevin Bradley</au><au>KATAMREDDY, Krishna Sai Anirudh</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA</title><date>2024-03-21</date><risdate>2024</risdate><abstract>In an aspect, measurement processing circuitry may obtain, from a sensor, a first measured value of a measured object, the first measured value corresponding to a first power consumption level of the measured object at a first time point. The measurement processing circuitry may obtain, from the sensor, one or more second measured values of the measured object, the one or more second measured values corresponding to one or more second power consumption levels of the measured object at one or more second time points earlier than the first time point. The measurement processing circuitry may determine a corrected value based on the first measured value and the one or more second measured values, the corrected value representing the first power consumption level of the measured object at the first time point.</abstract><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	SENSOR MEASUREMENT CORRECTION BASED ON EMPIRICAL DATA
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