NANOFABRICATION METHOD WITH CORRECTION OF DISTORTION WITHIN AN IMPRINT SYSTEM

A nanofabrication method comprises receiving information regarding in-plane distortion of a substrate, modeling target out-of-plane displacement as a summation of a plurality of geometric modes represented by a linear combination of basis functions, generating a first drop pattern of formable materi...

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Bibliographische Detailangaben
Hauptverfasser: Im, Se-Hyuk, Cherala, Anshuman
Format: Patent
Sprache:eng
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