Patterning a Semiconductor Substrate

A method of forming a semiconductor device, where the method includes receiving a substrate in a processing chamber, the substrate including a first patterned layer including a metal-based material; and with a gaseous etch process, trimming the first patterned layer to form a second patterned layer,...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Liu, Eric Chih-Fang, Krawicz, Alexandra, Grzeskowiak, Steven
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method of forming a semiconductor device, where the method includes receiving a substrate in a processing chamber, the substrate including a first patterned layer including a metal-based material; and with a gaseous etch process, trimming the first patterned layer to form a second patterned layer, the gaseous etch process including exposing the first patterned layer to an un-ionized gas including a halogen compound.