ADAPTIVE INTEGRITY SCAN RATES IN A MEMORY SUB-SYSTEM BASED ON BLOCK HEALTH METRICS

ADAPTIVE INTEGRITY SCAN RATES IN A MEMORY SUB-SYSTEM BASED ON BLOCK HEALTH METRICS

A processing device in a memory sub-system detects an occurrence of a data integrity check trigger event and, responsive to the occurrence of the data integrity check trigger event, identifies a memory die of a plurality of memory dies. The processing device further associates each segment of the id...

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Bibliographische Detailangaben
Hauptverfasser: Smitchger, Christopher M, Khayat, Patrick R, Ratnam, Sampath K, Rayaprolu, Vamsi Pavan, Fitzpatrick, James
Format: Patent
Sprache:eng
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Zusammenfassung:A processing device in a memory sub-system detects an occurrence of a data integrity check trigger event and, responsive to the occurrence of the data integrity check trigger event, identifies a memory die of a plurality of memory dies. The processing device further associates each segment of the identified memory die with a respective group of a plurality of groups, each group representing one or more of a plurality of error mechanisms, and determines one or more respective adaptive scan frequencies for the identified memory die based on statistics of the segments associated with each respective group.