RAMAN-BASED SYSTEMS AND METHODS FOR MATERIAL IDENTIFICATION

Apparatuses, systems, and methods for analyzing a sample are provided. In some embodiments, a system includes a test assembly that comprises: a sample analyzer configured to provide data related to the sample; and a processing unit configured to analyze the data provided by the sample analyzer. The...

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Bibliographische Detailangaben
Hauptverfasser:	HUANG, Changhe, AUNER, Gregory William, MAJIDI, Ehsan
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Apparatuses, systems, and methods for analyzing a sample are provided. In some embodiments, a system includes a test assembly that comprises: a sample analyzer configured to provide data related to the sample; and a processing unit configured to analyze the data provided by the sample analyzer. The system is configured to identify at least one target in the sample.