IMPRINTING METHOD, IMPRINT APPARATUS AND ARTICLE MANUFACTURING METHOD
The throughput is improved by changing a timing of beginning aligning between a mold and a substrate depending on an area in a pattern-forming region where a pattern can be formed. An imprinting method for forming a pattern of an imprint material in a plurality of pattern-forming regions on a substr...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The throughput is improved by changing a timing of beginning aligning between a mold and a substrate depending on an area in a pattern-forming region where a pattern can be formed. An imprinting method for forming a pattern of an imprint material in a plurality of pattern-forming regions on a substrate using a mold having a pattern portion, having contacting the mold and the imprint material and relatively aligning the mold and the pattern-forming region based on a positional relationship between the mold and an alignment mark of each pattern-forming region, in which, in the aligning, a timing of beginning the aligning is earlier relative to the contacting if an area in the plurality of pattern-forming regions where a pattern can be formed is a second area that is wider than a first area than if an area is the first area. |
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