ELECTRON-OPTICAL DEVICE

Disclosed herein is a charged-particle apparatus configured to inspect a sample with a charged-particle beam. The charged-particle apparatus comprises a detector assembly or an array of multipole elements. The charged-particle apparatus comprises an electronic device, a power source configured to ou...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: STEENBRINK, Stijn Wilem Herman Karel
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Disclosed herein is a charged-particle apparatus configured to inspect a sample with a charged-particle beam. The charged-particle apparatus comprises a detector assembly or an array of multipole elements. The charged-particle apparatus comprises an electronic device, a power source configured to output radiation, and a power converter configured to receive radiation from the power source, to convert the received radiation into electrical energy and to output the electrical energy to the electronic device. The power source is electrically isolated from the power converter.