Method and System for Material Identification Using Magnetic Induction Tomography

Methods and apparatuses of identifying a type of material or material combination in a measurement location by Magnetic Induction Tomography (MIT) is disclosed. The methods can comprise providing a primary magnetic field primarily in a first direction into the measurement location; measuring an orth...

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Bibliographische Detailangaben
Hauptverfasser:	Gartman, Rafal, Chalupczak, Witold
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Methods and apparatuses of identifying a type of material or material combination in a measurement location by Magnetic Induction Tomography (MIT) is disclosed. The methods can comprise providing a primary magnetic field primarily in a first direction into the measurement location; measuring an orthogonal component of a secondary magnetic field; classifying the orthogonal component of the secondary magnetic field with reference to a material or material combination type and thereby identifying a type of material or material combination in the measurement location. The orthogonal component of the secondary magnetic field is in a direction substantially orthogonal to the first direction.