MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM

A management system for a manufacturing facility including a manufacturing device including one or more device members for manufacturing a product, and an inspection device, the system including a display unit, a device member information acquisition unit, a product member information acquisition un...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TANAKA, Mayuko, SAJI, Keita, MORI, Hiroyuki
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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