MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM

A management system for a manufacturing facility including a manufacturing device including one or more device members for manufacturing a product, and an inspection device, the system including a display unit, a device member information acquisition unit, a product member information acquisition unit, a manufacturing abnormality information acquisition unit, an improvement candidate information acquisition unit configured to acquire improvement candidate information about candidates for improvement in the manufacturing facility, and a management work support unit configured to create list information and to cause the display unit to display the list information, the list information including an aggregated value of abnormalities of each sort during manufacturing the product and an aggregated value of abnormalities of each sort during inspecting the product within a predetermined aggregation time period, for each device member and/or product member as the candidate for improvement.