CONFIGURATION OF CONFIGURABLE TEST LOGIC

In some examples, a computing device includes a first reset domain including a test controller and a configurable test logic. The computing device includes a second reset domain including a subsystem to be measured by the configurable test logic. The first reset domain is to enter a reset mode, and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Robertson, Naysen J, Wesneski, Christopher M, Gonzalez, Samuel
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In some examples, a computing device includes a first reset domain including a test controller and a configurable test logic. The computing device includes a second reset domain including a subsystem to be measured by the configurable test logic. The first reset domain is to enter a reset mode, and after exiting the reset mode, receive configuration information that configures the configurable test logic. The test controller of the first reset domain is to maintain the second reset domain in a reset mode after the first reset domain has exited the reset mode of the first reset domain, and responsive to the received configuration information for configuring the configurable test logic, provide a reset release indication to the second reset domain to allow the second reset domain to exit the reset mode of the second reset domain.