DEFECT DETECTION METHOD, DEVICE AND SYSTEM

A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscal...

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Bibliographische Detailangaben
Hauptverfasser: Xie, Jintan, Niu, Maolong, Huang, Qiangwei, Liu, Yongfa
Format: Patent
Sprache:eng
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Zusammenfassung:A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscale value greater than or equal to a reference value is a first value, a mapped value corresponding to a grayscale value less than the reference value is a second value, and the reference value is an absolute value of a difference between the average grayscale value and a preset grayscale value; searching for a mapped value corresponding to a grayscale value of each pixel in the image from the mapping table; segmenting the image to obtain a suspicious defect sub-image based on the mapped value corresponding to the grayscale value of each pixel; and inputting the suspicious defect sub-image into a machine learning model.