ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modul...
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creator | PARK, Sang Tae MASIEL, Daniel Joseph BLOOM, Ruth Shewmon REED, Bryan Walter |
description | A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023411112A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023411112A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023411112A13</originalsourceid><addsrcrecordid>eNrjZLB0DHLyDAlyDIpUcPVxdQ4J8vdTcPEPdlUIdwxzdfMP8g1WAJIIOV9P5yD_YGf_gEgeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGRsYggERo6GxsSpAgBXyyny</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY</title><source>esp@cenet</source><creator>PARK, Sang Tae ; MASIEL, Daniel Joseph ; BLOOM, Ruth Shewmon ; REED, Bryan Walter</creator><creatorcontrib>PARK, Sang Tae ; MASIEL, Daniel Joseph ; BLOOM, Ruth Shewmon ; REED, Bryan Walter</creatorcontrib><description>A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231221&DB=EPODOC&CC=US&NR=2023411112A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231221&DB=EPODOC&CC=US&NR=2023411112A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PARK, Sang Tae</creatorcontrib><creatorcontrib>MASIEL, Daniel Joseph</creatorcontrib><creatorcontrib>BLOOM, Ruth Shewmon</creatorcontrib><creatorcontrib>REED, Bryan Walter</creatorcontrib><title>ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY</title><description>A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB0DHLyDAlyDIpUcPVxdQ4J8vdTcPEPdlUIdwxzdfMP8g1WAJIIOV9P5yD_YGf_gEgeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGRsYggERo6GxsSpAgBXyyny</recordid><startdate>20231221</startdate><enddate>20231221</enddate><creator>PARK, Sang Tae</creator><creator>MASIEL, Daniel Joseph</creator><creator>BLOOM, Ruth Shewmon</creator><creator>REED, Bryan Walter</creator><scope>EVB</scope></search><sort><creationdate>20231221</creationdate><title>ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY</title><author>PARK, Sang Tae ; MASIEL, Daniel Joseph ; BLOOM, Ruth Shewmon ; REED, Bryan Walter</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023411112A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>PARK, Sang Tae</creatorcontrib><creatorcontrib>MASIEL, Daniel Joseph</creatorcontrib><creatorcontrib>BLOOM, Ruth Shewmon</creatorcontrib><creatorcontrib>REED, Bryan Walter</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PARK, Sang Tae</au><au>MASIEL, Daniel Joseph</au><au>BLOOM, Ruth Shewmon</au><au>REED, Bryan Walter</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY</title><date>2023-12-21</date><risdate>2023</risdate><abstract>A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
title | ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY |
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