Pin Testing System for Multi-Pin Chip and Method Thereof

A pin testing system for a multi-pin chip and method thereof are disclosed. In the system, a chip testing circuit board includes a testing circuit, a to-be-tested chip fixture, a testing chip and a JTAG port, each pin of the testing chip is electrically connected to a corresponding pin of the to-be-tested chip fixture through the testing circuit. The JTAG port, the testing chip and the to-be-tested chip fixture are serially connected to form a JTAG link through the testing circuit, the testing device, the JTAG controller and the chip testing circuit board are serially connected, the testing device generates a testing signal to test each of the pins of the to-be-tested chip through the JTAG controller, and a testing result for each of the pins is transmitted to the testing device, so that the testing on the pins of the to-be-tested chip is completed.