CUTTING TOOL

A cutting tool includes a substrate and a hard layer, whereinthe hard layer includes a first unit layer and a second unit layer being alternately layered in the hard layer,a thickness of the first unit layer is 2 to 100 nm,a thickness of the second unit layer is 2 to 100 nm,the first unit layer is c...

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Bibliographische Detailangaben
Hauptverfasser: SUZUKI, Yuta, FUKAE, Kosuke
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A cutting tool includes a substrate and a hard layer, whereinthe hard layer includes a first unit layer and a second unit layer being alternately layered in the hard layer,a thickness of the first unit layer is 2 to 100 nm,a thickness of the second unit layer is 2 to 100 nm,the first unit layer is composed of TiaAlbBcN,the second unit layer is composed TidAleBfN,an atomic ratio a satisfy 0.25≤a