AI-BASED DEFECT DIAGNOSIS SYSTEM AND METHOD

An artificial intelligence (AI)-based defect diagnosis system for automatic identification of one or more defect drivers in a manufacturing environment is presented. The diagnosis system includes an input data module, an input specifications module, a product selection module, a product grouping mod...

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Bibliographische Detailangaben
Hauptverfasser:	TEWARI, Naveen, BOTCHA, Dileep Kumar, LANJEWAR, Ketan, KUMAR, Amar, KALPANDE, Abhijeet Ganesh, SINGH, Ajeet, JOSHI, Gopal Datt, ALPERT, Jeffrey Yale
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An artificial intelligence (AI)-based defect diagnosis system for automatic identification of one or more defect drivers in a manufacturing environment is presented. The diagnosis system includes an input data module, an input specifications module, a product selection module, a product grouping module, a defect driver identification module, and an output module. A related method is also presented.