CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising performing a first read operation on the memory device to retrieve first data; determining, from the first data, second data indicative of a write temperature associated with the first data, wherein the write temperature is indicative of a temperature measured during a write operation; determining a read voltage value based on the second data; and performing a second read operation on the memory device using the read voltage value to obtain the first data.