SEMICONDUCTOR DEVICE

A method includes forming a fin in a substrate. The fin is etched to create a source/drain recess. A source/drain feature is formed in the source/drain recess, in which a lattice constant of the source/drain feature is greater than a lattice constant of the fin. An epitaxy coat is grown over the sou...

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Bibliographische Detailangaben
Hauptverfasser: CHEN, Ting-Yeh, LEE, Wei-Yang, LI, Chii-Horng, YANG, Feng-Cheng
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method includes forming a fin in a substrate. The fin is etched to create a source/drain recess. A source/drain feature is formed in the source/drain recess, in which a lattice constant of the source/drain feature is greater than a lattice constant of the fin. An epitaxy coat is grown over the source/drain feature, in which a lattice constant of the epitaxy coat is smaller than a lattice constant of the fin.